DocumentCode
970107
Title
Support Vector Regression for Measuring Electromagnetic Parameters of Magnetic Thin-Film Materials
Author
Wu, Yunqiu ; Tang, Zongxi ; Xu, Yuehang ; Guo, Yunchuan ; Zhang, Biao
Author_Institution
Univ.of Electron. Sci. & Technol. of China, Chengdu
Volume
43
Issue
12
fYear
2007
Firstpage
4071
Lastpage
4075
Abstract
We propose a novel method for extracting the electromagnetic parameters (complex permittivity and permeability) of magnetic thin-film materials. The method extracts electromagnetic parameters of the magnetic thin films from effective electromagnetic parameters by using the supported vector machine (SVM). We validated the method in the frequency range of 1-8 GHz. The results show that the errors for both epsiv´ and mu´ are less than 0.5%, and the errors of both tan deltaepsiv and tan deltamu are less than 0.001.
Keywords
magnetic permeability; magnetic permeability measurement; magnetic thin films; permittivity; permittivity measurement; regression analysis; SVM; complex permittivity; electromagnetic parameter measurement; magnetic thin-film materials; measurement errors; permeability; support vector regression; supported vector machine; Complex permeability; complex permittivity; microwave measurement; support vector machine (SVM);
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2007.908372
Filename
4380283
Link To Document