DocumentCode
970151
Title
Mechanism of Aging in Pd-Ag Thick-Film Resistors
Author
Taketa, Yoshiaki ; Haradome, Miyoshi
Author_Institution
Nihon Univ., Japan
Volume
9
Issue
2
fYear
1973
fDate
6/1/1973 12:00:00 AM
Firstpage
115
Lastpage
122
Abstract
Accelerated life tests under elevated temperarure, high humidity, and vacuum have been conducted on Pd-Ag thick-film resistors It is found that the change of resistance under those accelerated life test conditions is mainly caused by oxidation and reduction of the electrically conductive components (Pd and Ag) of Pd-Ag thick-film resistors. Through life tests in vacuum, the effect of adsorption was found to be less important than the structural change inside the resistor.
Keywords
Life testing; Thick-film resistors; Aging; Fabrication; Firing; Glass; Life estimation; Life testing; Oxidation; Printing; Resistors; Temperature;
fLanguage
English
Journal_Title
Parts, Hybrids, and Packaging, IEEE Transactions on
Publisher
ieee
ISSN
0361-1000
Type
jour
DOI
10.1109/TPHP.1973.1136716
Filename
1136716
Link To Document