• DocumentCode
    970246
  • Title

    Modeling Software Behavior in Terms of a Formal Life Cycle Curve: Implications for Software Maintenance

  • Author

    Ehrlich, Willa Kay Wiener ; Hamrick, James R. ; Rupolo, Vincent F.

  • Author_Institution
    Bankers Trust Company, New York, NY 10006.; AT&T Bell Laboratories, Piscataway, NJ.
  • Issue
    4
  • fYear
    1984
  • fDate
    7/1/1984 12:00:00 AM
  • Firstpage
    376
  • Lastpage
    383
  • Abstract
    In this paper, a formal model of the software manloading pattern, the Rayleigh model, is described and then applied to four Bankers Trust Company (BTCo.) new development projects possessing complete life cycle manloading data (maintenance phase included). To fit the Rayleigh curve to a project´s manloading scores, (nonlinear) regression was used to obtain least squares estimates of the Rayleigh parameters, which, in turn, were used to generate the Rayleigh manloading curve. For all four projects, deviation from the Rayleigh curve was small and constant throughout the software development phases (i.e., preliminary design through implementation); however, the Rayleigh curve consistently deviated from the actual manloading during system maintenance, underestimating the amount of maneffort expended. Restricting maintenance maneffort to manpower expended on repair of system faults (``corrective´´ maintenance) resulted in a single Rayleigh curve that could be applied over the entire BTCo. life cycle. Furthermore, this corrective portion of the maintenance effort could be accurately forecasted from the Rayleigh curve fit to software development. Implications of these findings for software management are discussed.
  • Keywords
    Large-scale systems; Load forecasting; Logistics; Mathematical model; Pattern analysis; Predictive models; Programming; Project management; Software development management; Software maintenance; Corrective maintenance; Rayleigh model; development project; empirical; fitted curve; forecasting software maintenancce; formal model of software life cycle; projected curve; residual score;
  • fLanguage
    English
  • Journal_Title
    Software Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0098-5589
  • Type

    jour

  • DOI
    10.1109/TSE.1984.5010250
  • Filename
    5010250