DocumentCode :
970410
Title :
Test generation and concurrent error detection in current-mode A/D converters
Author :
Wey, Chin-Long ; Krishnan, Shoba ; Sahli, Sondes
Author_Institution :
Dept. of Electr. Eng., Michigan State Univ., East Lansing, MI, USA
Volume :
14
Issue :
10
fYear :
1995
fDate :
10/1/1995 12:00:00 AM
Firstpage :
1291
Lastpage :
1298
Abstract :
Analog MOS circuits are becoming increasingly sophisticated in terms of checking and correcting themselves. Self-correcting, self-compensating, or self-calibrating techniques has been employed in analog-to-digital (A/D) converters to eliminate errors caused by offset and low frequency noise and cancel the error effect. For real-time applications, however, it is rather difficult to achieve validation of the converted data in the presence of faulty switching element(s). In this paper, fault behaviors and test generation of a current-mode A/D converter are addressed. Results show that the converter achieves full testability with two test currents. In addition, an A/D converter with concurrent error detection capability is proposed. The converter detects all transient faults
Keywords :
analogue-digital conversion; design for testability; error detection; fault diagnosis; integrated circuit testing; A/D converters; concurrent error detection; concurrent error detection capability; current-mode ADC; fault behavior; real-time applications; test generation; testability; transient fault detection; Analog-digital conversion; Circuit faults; Circuit testing; Computer errors; Electrical fault detection; Error correction; Fault detection; Integrated circuit testing; Switching converters; System testing;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.466344
Filename :
466344
Link To Document :
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