• DocumentCode
    970553
  • Title

    Figures of Merit for Field Homogeneity in TEM Waveguides

  • Author

    Pouhe, D. ; Monich, Gerhard

  • Author_Institution
    Tech. Univ. of Berlin, Berlin
  • Volume
    49
  • Issue
    4
  • fYear
    2007
  • Firstpage
    792
  • Lastpage
    804
  • Abstract
    The homogeneity of the transverse electromagnetic (TEM) field in a TEM device is a necessary condition for the compliance of emission and immunity measurements in TEM test facilities with standards. Under these conditions, the behavior of the TEM mode over the desired frequency range has to be verified. This homogeneity, indeed a figure of merit of the waveguide, is investigated using the generalized postulates presented in this work in combination with some calibration procedures defined in the standards. Verification of the postulates provides a valuable insight into the field distribution within the considered TEM line facility, since the obtained results are in excellent agreement with the measured fields. The maximum transverse and longitudinal polarization errors, which can be normally tolerated in order for the field to be considered as a TEM wave, are derived from the copolar field. As a result, the savings in the measurements are achieved. Finally, the consistency obtained upon direct comparison of different TEM test facilities confirms the applicability of the model.
  • Keywords
    TEM cells; electromagnetic fields; waveguide theory; TEM cells; TEM test facilities; TEM waveguides; copolar field; field homogeneity; longitudinal polarization errors; transverse electromagnetic field; Electromagnetic compatibility; Electromagnetic measurements; Electromagnetic scattering; Electromagnetic wave polarization; Electromagnetic waveguides; Immunity testing; Rectangular waveguides; TEM cells; Test facilities; Wire; Field homogeneity; longitudinal polarization error; transverse electromagnetic (TEM) waveguide; transverse polarization error; uniform area;
  • fLanguage
    English
  • Journal_Title
    Electromagnetic Compatibility, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9375
  • Type

    jour

  • DOI
    10.1109/TEMC.2007.908803
  • Filename
    4380429