DocumentCode
971071
Title
Dynamics of an asymmetric nondestructive read out memory cell
Author
Beha, H.
Author_Institution
Universität Karlsruhe, Germany
Volume
15
Issue
1
fYear
1979
fDate
1/1/1979 12:00:00 AM
Firstpage
424
Lastpage
427
Abstract
In single flux quantum interferometer memory cells the information can be stored without bias current, if the interferometer inductance L is chosen sufficiently large (
) to allow for three stable states (-1-, 0-, 1-mode) at zero control and gate current. In this case the binary informations are represented by the -1- and 0-mode of the interferometer. The nondestructive read out operation of a binary "1" is performed without a transition into another mode or into the voltage state. The binary "1" corresponds to no sense signal. Nondestructive read out of the binary "0" is achieved in switching to the voltage state and in returning to the 0-mode after the end of the drive currents. In this paper the dynamics of switching back into the zero voltage state are investigated by simulations of trajectories in the order parameter phase plane. It is shown that for realistic fabrication tolerances the interferometer settles in the wanted 0-mode and not in the -1- or 1-mode even under severe gate or control current disturbs, if the maximum Josephson currents of the two Josephson junctions are unequal (2:1) and if the McCumber damping factor is sufficiently large (
).
) to allow for three stable states (-1-, 0-, 1-mode) at zero control and gate current. In this case the binary informations are represented by the -1- and 0-mode of the interferometer. The nondestructive read out operation of a binary "1" is performed without a transition into another mode or into the voltage state. The binary "1" corresponds to no sense signal. Nondestructive read out of the binary "0" is achieved in switching to the voltage state and in returning to the 0-mode after the end of the drive currents. In this paper the dynamics of switching back into the zero voltage state are investigated by simulations of trajectories in the order parameter phase plane. It is shown that for realistic fabrication tolerances the interferometer settles in the wanted 0-mode and not in the -1- or 1-mode even under severe gate or control current disturbs, if the maximum Josephson currents of the two Josephson junctions are unequal (2:1) and if the McCumber damping factor is sufficiently large (
).Keywords
Josephson device memories; NDRO memories; Damping; Equivalent circuits; Fabrication; Inductance; Josephson effect; Josephson junctions; Laboratories; Prototypes; Random access memory; Zero voltage switching;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1979.1060273
Filename
1060273
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