Title :
Three period (Al,Ga)As/GaAs heterostructures with extremely high mobilities
Author :
Drummond, T.J. ; Kopp, W. ; Morko¿¿, H.
Author_Institution :
University of Illinois, Department of Electrical Engineering and Coordinated Science Laboratory, Urbana, USA
Abstract :
Selectively doped three period Al0.2Ga0.8As/GaAs structures have been grown by molecular beam epitaxy and characterised by Hall effect over a temperature range of 10 K¿300 K. Electron mobilities as high as 211 000, 95 800 and 6700 cm2V¿1s¿1 have been obtained at 10 K, 78 K and 300 K, respectively. The total charge concentration in all the structures was about 2.25Ã1012 cm¿2. These extremely high electron mobilities are a result of separating the donors and the electrons appreciably, and very-high-quality interfaces. To date, the figures at 78 K are the highest reported, while the 10 K figures are about twice the best previously reported results.
Keywords :
Hall effect; III-V semiconductors; carrier mobility; gallium arsenide; p-n heterojunctions; 10K-300K; Al0.2Ga0.8As/GaAs; Hall effect; charge concentration; electron mobility; molecular beam epitaxy;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19810310