DocumentCode
971847
Title
Testing embedded memories [New Products]
Volume
12
Issue
3
fYear
1995
Firstpage
9
Keywords
Assembly; Automatic testing; Built-in self-test; Control system synthesis; EPROM; Emulation; Pricing; Read-write memory; Software testing; System testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466360
Filename
466360
Link To Document