• DocumentCode
    971980
  • Title

    Voltage Spikes in \\hbox {Nb}_{3}\\hbox {Sn} and NbTi Strands

  • Author

    Bordini, B. ; Ambrosio, G. ; Barzi, E. ; Carcagno, R. ; Feher, S. ; Kashikhin, V.V. ; Lamm, M.J. ; Orris, D. ; Tartaglia, M. ; Tompkins, J.C. ; Turrioni, D. ; Yamada, R. ; Zlobin, A.V.

  • Author_Institution
    Fermi Nat. Accel. Lab.
  • Volume
    16
  • Issue
    2
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    366
  • Lastpage
    369
  • Abstract
    As part of the High Field Magnet program at Fermilab several NbTi and Nb3Sn strands were tested with particular emphasis on the study of voltage spikes and their relationship to superconductor instabilities. The voltage spikes were detected under various experimental conditions using voltage-current (V-I) and voltage-field (V-H) methods. Two types of spikes, designated ´magnetization´ and ´transport current´ spikes, have been identified. Their origin is most likely related to magnetization flux jump and transport current redistribution, respectively. Many of the signals observed appear to be a combination of these two types of spikes; the combination of these two instability mechanisms should play a dominant role in determining the minimum quench current
  • Keywords
    accelerator magnets; critical currents; magnetisation; niobium alloys; particle accelerators; superconducting magnets; superconducting materials; tin alloys; titanium alloys; transport processes; Fermilab; Nb3Sn; Nb3Sn strands; NbTi; NbTi Strands; magnetization flux jump; magnetization spikes; quench current; superconducting accelerator magnets; superconductor instabilities; transport current redistribution; transport current spikes; voltage spikes; voltage-current methods; voltage-field methods; Conductors; Magnetic flux; Niobium compounds; Signal generators; Superconducting cables; Superconducting magnets; System testing; Tin; Titanium compounds; Voltage; Instability; magnet; voltage spike;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2006.871319
  • Filename
    1642864