• DocumentCode
    972457
  • Title

    Invariant Measures of Tunable Chaotic Sources: Robustness Analysis and Efficient Estimation

  • Author

    Addabbo, Tommaso ; Fort, Ada ; Papini, Duccio ; Rocchi, Santina ; Vignoli, Valerio

  • Author_Institution
    Dept. of Inf. Eng., Univ. of Siena, Siena
  • Volume
    56
  • Issue
    4
  • fYear
    2009
  • fDate
    4/1/2009 12:00:00 AM
  • Firstpage
    806
  • Lastpage
    819
  • Abstract
    In this paper, a theoretical approach for studying the robustness of the chaotic statistics of piecewise affine maps with respect to parameter perturbations is discussed. The approach is oriented toward the study of the effects that the nonidealities derived from the circuit implementation of these chaotic systems have on their dynamics. The ergodic behavior of these systems is discussed in detail, adopting the approach developed by Boyarsky and Gora, with particular reference to the family of sawtooth maps, and the robustness of their invariant measures is studied. Although this paper is particularly focused on this specific family of maps, the proposed approach can be generalized to other piecewise affine maps considered in the literature for information and communications technology applications. Moreover, in this paper, an efficient method for estimating the unique invariant density for stochastically stable piecewise affine maps is proposed. The method is an alternative to Monte Carlo methods and to other methods based on the discretization of the Frobenius-Perron operator.
  • Keywords
    chaos; statistical analysis; Frobenius-Perron operator; Monte Carlo methods; chaotic statistics; circuit implementation; ergodic behavior; invariant measures; parameter perturbations; piecewise afflne maps; sawtooth maps; tunable chaotic sources; unique invariant density; Chaos; ergodic theory; information theory; nonlinear circuits; nonlinear systems;
  • fLanguage
    English
  • Journal_Title
    Circuits and Systems I: Regular Papers, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1549-8328
  • Type

    jour

  • DOI
    10.1109/TCSI.2008.2003380
  • Filename
    4663652