DocumentCode
972520
Title
Analysis of the inductive turn-off of double gate MOS controlled thyristors
Author
Huang, Alex Q.
Author_Institution
Virginia Power Electron. Centre, Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Volume
43
Issue
6
fYear
1996
fDate
6/1/1996 12:00:00 AM
Firstpage
1029
Lastpage
1032
Abstract
High voltage inductive turn-off of double gate MOS Controlled Thyristors (MCTs) are analyzed using two-dimensional numerical simulations. Analysis shows that beside the significantly improved maximum controllable current and reduced switching loss, the electric field distribution in these devices has two peaks during inductive turn-off, enabling the maximum turn-off power density to be twice as high as that of the single gate devices. This observation also applies to other double gate bipolar power devices such as double gate Insulated Gate Bipolar Transistors (IGBTs)
Keywords
MOS-controlled thyristors; digital simulation; electric fields; losses; semiconductor device models; semiconductor device reliability; double gate MOS controlled thyristors; electric field distribution; inductive turn-off; maximum controllable current; switching loss; turn-off power density; two-dimensional numerical simulations; Anodes; Cathodes; Insulated gate bipolar transistors; MOSFETs; Medical simulation; Numerical simulation; Switching loss; Tail; Thyristors; Voltage control;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.502140
Filename
502140
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