• DocumentCode
    972520
  • Title

    Analysis of the inductive turn-off of double gate MOS controlled thyristors

  • Author

    Huang, Alex Q.

  • Author_Institution
    Virginia Power Electron. Centre, Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • Volume
    43
  • Issue
    6
  • fYear
    1996
  • fDate
    6/1/1996 12:00:00 AM
  • Firstpage
    1029
  • Lastpage
    1032
  • Abstract
    High voltage inductive turn-off of double gate MOS Controlled Thyristors (MCTs) are analyzed using two-dimensional numerical simulations. Analysis shows that beside the significantly improved maximum controllable current and reduced switching loss, the electric field distribution in these devices has two peaks during inductive turn-off, enabling the maximum turn-off power density to be twice as high as that of the single gate devices. This observation also applies to other double gate bipolar power devices such as double gate Insulated Gate Bipolar Transistors (IGBTs)
  • Keywords
    MOS-controlled thyristors; digital simulation; electric fields; losses; semiconductor device models; semiconductor device reliability; double gate MOS controlled thyristors; electric field distribution; inductive turn-off; maximum controllable current; switching loss; turn-off power density; two-dimensional numerical simulations; Anodes; Cathodes; Insulated gate bipolar transistors; MOSFETs; Medical simulation; Numerical simulation; Switching loss; Tail; Thyristors; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.502140
  • Filename
    502140