DocumentCode
972544
Title
Accelerating the pace of R&D in Asia
Author
Yamada, Tomoaki
Volume
12
Issue
3
fYear
1995
Firstpage
12
Keywords
Acceleration; Asia; Circuit faults; Circuit testing; Design automation; Life estimation; Logic testing; Research and development; Sequential circuits; Very large scale integration;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466366
Filename
466366
Link To Document