• DocumentCode
    973028
  • Title

    Concurrent error detection using monitoring machines

  • Author

    Parekhji, Rubin A. ; Venkatesh, G. ; Sherlekar, Sunil D.

  • Volume
    12
  • Issue
    3
  • fYear
    1995
  • Firstpage
    24
  • Keywords
    Circuit faults; Circuit testing; Computerized monitoring; Condition monitoring; Delay; Electrical fault detection; Fault detection; Hardware; Logic testing; Sequential circuits;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.1995.466370
  • Filename
    466370