• DocumentCode
    973099
  • Title

    Performance of a scaled Si gate n-well CMOS technology

  • Author

    Zimmer, G. ; Fiedler, H. ; Hoefflinger, B. ; Neubert, E. ; Vogt, H.

  • Author_Institution
    Universitÿt Dortmund, Lehrstuhl Bauelemente der Elektrotechnik, Dortmund, West Germany
  • Volume
    17
  • Issue
    18
  • fYear
    1981
  • Firstpage
    666
  • Lastpage
    667
  • Abstract
    A scaled n-well CMOS technology with 40 nm gate oxide, 1 ¿m PMOS and 2 ¿m NMOS transistors has been realised with peak effective mobilities of 710 and 260 cm2V¿1s¿1 for electrons and holes, respectively, and available voltage gains as high as 80 for a 1 ¿m PMOS and 115 for a 2 ¿m NMOS transistor. The corresponding maximum inverter gain was 75. The inverter supply voltage range was 1.5 to 12 V and the inverter delay time was 300 ps at 5 V supply voltage.
  • Keywords
    field effect integrated circuits; integrated circuit technology; NMOS transistors; PMOS transistor; effective mobilities; inverter gain; scaled Si gate n-well CMOS technology; voltage gains;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810465
  • Filename
    4245942