DocumentCode
973175
Title
Analysis of media defects in thick recording media
Author
Hoagland, A.S. ; Oehme, W.F. ; Talke, F.E.
Author_Institution
IBM Research Laboratory, San Jose, California
Volume
15
Issue
6
fYear
1979
fDate
11/1/1979 12:00:00 AM
Firstpage
1552
Lastpage
1554
Abstract
The defect behavior of thick particulate media is investigated by introducing artificial defects of known depth, measuring their signal loss characteristics as a function of frequency, and then relating actual measured drop-out lengths to the experimentally determined artificial defect depth data. The results indicate that the number of drop-outs per track is exponentially related to a "critical depth" parameter. The data can be used to extrapolate density capabilities of a given medium using a set of experimental artificial defect data taken at a lower performance level.
Keywords
Magnetic disk recording; Density measurement; Frequency estimation; Frequency measurement; Laboratories; Length measurement; Loss measurement; Particle measurements; Shape; Size measurement; Thickness measurement;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1979.1060454
Filename
1060454
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