• DocumentCode
    973175
  • Title

    Analysis of media defects in thick recording media

  • Author

    Hoagland, A.S. ; Oehme, W.F. ; Talke, F.E.

  • Author_Institution
    IBM Research Laboratory, San Jose, California
  • Volume
    15
  • Issue
    6
  • fYear
    1979
  • fDate
    11/1/1979 12:00:00 AM
  • Firstpage
    1552
  • Lastpage
    1554
  • Abstract
    The defect behavior of thick particulate media is investigated by introducing artificial defects of known depth, measuring their signal loss characteristics as a function of frequency, and then relating actual measured drop-out lengths to the experimentally determined artificial defect depth data. The results indicate that the number of drop-outs per track is exponentially related to a "critical depth" parameter. The data can be used to extrapolate density capabilities of a given medium using a set of experimental artificial defect data taken at a lower performance level.
  • Keywords
    Magnetic disk recording; Density measurement; Frequency estimation; Frequency measurement; Laboratories; Length measurement; Loss measurement; Particle measurements; Shape; Size measurement; Thickness measurement;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1979.1060454
  • Filename
    1060454