DocumentCode
973355
Title
Multiple fault diagnosis by sensitizing input pairs
Author
Yanagida, Nobuhiro ; Takahashi, Hiroshl ; Takamatsu, Yuzo
Volume
12
Issue
3
fYear
1995
Firstpage
44
Keywords
Circuit faults; Circuit testing; Combinational circuits; Dictionaries; Fault detection; Fault diagnosis; Fault location; Large scale integration; Logic design; Logic testing;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1995.466375
Filename
466375
Link To Document