• DocumentCode
    973863
  • Title

    Scanning the Transistor Issue

  • Author

    Angello, Stephen J.

  • Author_Institution
    Westinghouse Research Labs., Pittsburgh 35, Pa.
  • Volume
    46
  • Issue
    6
  • fYear
    1958
  • fDate
    6/1/1958 12:00:00 AM
  • Firstpage
    949
  • Lastpage
    951
  • Abstract
    The Solid-State Devices Committee of the IRE and AIEE which organized this special issue felt it proper to honor the co-inventors of the transistor. To this end we have asked each gentleman to write a short essay, and these are given first place in the body of this issue. We delight in paying tribute to the superb experimental technique of Dr. Brattain, the deep theoretical understanding of Dr. Bardeen, and the creative genius of Dr. Shockley. There are sixteen invited papers in this issue. The honor to the authors of these papers is enhanced by the method by which they were chosen. A letter survey was conducted asking nationally prominent men in the field to suggest authors for topics we considered desirable to cover in this issue. In most cases the authors were selected by popular vote in this survey. Our list of topics also was enhanced by the same survey. Many thousands of man hours have gone into the preparation of this issue and we hope it will serve the field for many years to come as an important reference work.
  • Keywords
    Charge carrier density; Charge carriers; Electrons; Germanium; P-n junctions; Solid state circuits; Transistors;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1958.286830
  • Filename
    4065431