• DocumentCode
    974149
  • Title

    Measurement of Transistor Thermal Resistance

  • Author

    Reich, Bernard

  • Author_Institution
    U. S. Army Signal Eng. Labs., Ft. Monmouth, N.J.
  • Volume
    46
  • Issue
    6
  • fYear
    1958
  • fDate
    6/1/1958 12:00:00 AM
  • Firstpage
    1204
  • Lastpage
    1207
  • Abstract
    A method of measuring the thermal resistance of transistors using the collector cutoff current as an indicator is described. The author uses a series of two steps to determine the overall junction-to-ambient thermal resistance. This type of arrangement is most accurate and less time consuming than the one-step over-all junction-to-ambient measurement.
  • Keywords
    Current measurement; Electrical resistance measurement; Germanium; Power measurement; Power transistors; Silicon; Temperature; Thermal resistance; Time measurement; Voltage;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1958.286903
  • Filename
    4065462
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=974149