DocumentCode
974767
Title
CCD linear image sensor with buried overflow drain structure
Author
Goto, Hiromi ; Sekine, H. ; Yamada, Tomoaki ; Suzuki, Nobuhiro
Author_Institution
Toshiba Corporation, Semiconductor Division, Kawasaki, Japan
Volume
17
Issue
24
fYear
1981
Firstpage
904
Lastpage
905
Abstract
A CCD linear image sensor with buried overflow drain structure has been developed. Since the overflow drain, i.e. a reverse biased n-region buried under photosites arrayed in p-layer, makes an effective sink of excess electrons, imaging characteristics such as uniformity of photosensitivity, spectral response, resolution, and antiblooming, are highly improved.
Keywords
charge-coupled device circuits; image sensors; CCD linear image sensor; buried overflow drain structure; imaging characteristics; optoelectronic devices;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19810630
Filename
4246113
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