• DocumentCode
    974767
  • Title

    CCD linear image sensor with buried overflow drain structure

  • Author

    Goto, Hiromi ; Sekine, H. ; Yamada, Tomoaki ; Suzuki, Nobuhiro

  • Author_Institution
    Toshiba Corporation, Semiconductor Division, Kawasaki, Japan
  • Volume
    17
  • Issue
    24
  • fYear
    1981
  • Firstpage
    904
  • Lastpage
    905
  • Abstract
    A CCD linear image sensor with buried overflow drain structure has been developed. Since the overflow drain, i.e. a reverse biased n-region buried under photosites arrayed in p-layer, makes an effective sink of excess electrons, imaging characteristics such as uniformity of photosensitivity, spectral response, resolution, and antiblooming, are highly improved.
  • Keywords
    charge-coupled device circuits; image sensors; CCD linear image sensor; buried overflow drain structure; imaging characteristics; optoelectronic devices;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19810630
  • Filename
    4246113