• DocumentCode
    975185
  • Title

    Multigigahertz Causal Transmission Line Modeling Methodology Using a 3-D Hemispherical Surface Roughness Approach

  • Author

    Hall, Stephen ; Pytel, Steven G. ; Huray, Paul G. ; Hua, Daniel ; Moonshiram, Anusha ; Brist, Gary A. ; Sijercic, Edin

  • Author_Institution
    Intel Corp., Hillsboro
  • Volume
    55
  • Issue
    12
  • fYear
    2007
  • Firstpage
    2614
  • Lastpage
    2624
  • Abstract
    As computer clock speeds continue to increase at a rate dictated by Moore´s Law, the system buses must also scale in proportion to the processor speed. As data rates increase beyond ~5 Gb/s, the historical methods used to model transmission lines start to break down and become inadequate for the proper prediction of signal integrity. Specifically, the traditional approximations made in transmission line models, while perfectly adequate for slower speeds, do not properly account for the extra losses caused by surface roughness and do not model the frequency dependence of the complex dielectric constant, producing incorrect loss and phase-delay responses, as well as noncausal waveforms in the time domain. This paper will discuss the problems associated with modeling transmission lines at high frequencies, and will provide a practical modeling methodology that accurately predicts responses for very high data rates.
  • Keywords
    dielectric losses; integrated circuit interconnections; permittivity; surface roughness; transmission line theory; Moore´s Law; dielectric constant; hemispherical surface roughness; integrated circuit interconnects; loss tangent; multigigahertz causal transmission line modeling; Clocks; Dielectric losses; Moore´s Law; Predictive models; Propagation losses; Rough surfaces; Surface roughness; Surface waves; System buses; Transmission lines; Causality; dielectric constant; interconnect; loss tangent; surface roughness; transmission line;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2007.910076
  • Filename
    4383174