DocumentCode
975303
Title
Time domain CAD and measurements of lossy coupled lines
Author
Zounon, A. ; Crozat, P. ; Adde, R.
Author_Institution
Inst. d´Electron Fondomentale, Univ. Paris Sud, Orsay, France
Volume
26
Issue
7
fYear
1990
fDate
3/29/1990 12:00:00 AM
Firstpage
473
Lastpage
474
Abstract
A model of multiple lossy microstrip lines on IC chips or cards is developed for direct time domain simulation of interconnections at a low computational cost. It is concerned with lines of equal widths with losses independent of frequency. Measurements of the step response in the tens of picoseconds range of three coupled lines on GaAs validate the model in severe test conditions of strong ohmic losses.
Keywords
circuit CAD; integrated logic circuits; logic CAD; losses; step response; strip line components; strip lines; time-domain analysis; CAD; GaAs; IC card; IC chips; direct time domain simulation; gigabit logic; interconnections; lossy coupled lines; model; multiple lossy microstrip lines; step response;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19900307
Filename
50238
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