Title :
Time domain CAD and measurements of lossy coupled lines
Author :
Zounon, A. ; Crozat, P. ; Adde, R.
Author_Institution :
Inst. d´Electron Fondomentale, Univ. Paris Sud, Orsay, France
fDate :
3/29/1990 12:00:00 AM
Abstract :
A model of multiple lossy microstrip lines on IC chips or cards is developed for direct time domain simulation of interconnections at a low computational cost. It is concerned with lines of equal widths with losses independent of frequency. Measurements of the step response in the tens of picoseconds range of three coupled lines on GaAs validate the model in severe test conditions of strong ohmic losses.
Keywords :
circuit CAD; integrated logic circuits; logic CAD; losses; step response; strip line components; strip lines; time-domain analysis; CAD; GaAs; IC card; IC chips; direct time domain simulation; gigabit logic; interconnections; lossy coupled lines; model; multiple lossy microstrip lines; step response;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19900307
