• DocumentCode
    975986
  • Title

    A method for identification of effective locations of variable impedance apparatus on enhancement of steady-state stability in large scale power systems

  • Author

    Okamoto, Hiroshi ; Kurita, Atsushi ; Sekine, Yasuji

  • Author_Institution
    Tokyo Electr. Power Co. Inc., Japan
  • Volume
    10
  • Issue
    3
  • fYear
    1995
  • fDate
    8/1/1995 12:00:00 AM
  • Firstpage
    1401
  • Lastpage
    1407
  • Abstract
    Variable impedance apparatus such as a static VAr compensator (SVC) and a variable series capacitor (VSC) can improve the steady-state stability of a power system if they are located appropriately. The present paper proposes an index for identifying the location of SVC and VSC in large scale power systems for effective damping. The index is called LIED (location index for effective damping) by the authors. Since LIED can be computed quickly for large scale power systems which have more than two hundred generators without conducting a number of digital simulations and eigenvalue analyses, it is valuable for the system planner who needs to identify the effective location of SVC and VSC. The proposed index is applied to the New England test system and its validity is demonstrated through digital simulations
  • Keywords
    circuit oscillations; control system analysis computing; controllability; damping; digital simulation; large-scale systems; power capacitors; power system analysis computing; power system control; power system stability; static VAr compensators; LIED; USA; computer simulation; damping; effective location identification; generators; large scale power systems; static VAr compensator; steady-state stability; variable impedance apparatus; variable series capacitor; Capacitors; Damping; Digital simulation; Impedance; Large-scale systems; Power system analysis computing; Power system simulation; Power system stability; Static VAr compensators; Steady-state;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.466512
  • Filename
    466512