DocumentCode :
976130
Title :
An overview of atomic and molecular processes in critical velocity ionization
Author :
Lai, Shu T. ; Murad, Edmond ; McNeil, William J.
Author_Institution :
Hanscom Air Force Base, Bedford, MA, USA
Volume :
17
Issue :
2
fYear :
1989
fDate :
4/1/1989 12:00:00 AM
Firstpage :
124
Lastpage :
134
Abstract :
The authors present an overview of the time development of some atomic and molecular processes in critical ionization velocity (CIV). In the preonset stage, metastable states play an important role: they provide an energy pooling mechanism allowing low-energy electrons to participate in the ionization process; they may explain the low energy threshold was well as the fast time scale in the onset of CIV. For a sustaining CIV to occur, Townsend´s criterion has to be satisfied. The kinetic energies of the neutrals are transformed to plasma wave energies via beam-plasma instabilities, and the plasma waves that heat the electron result in a tail formation. Excitation of neutrals with subsequent radiation is an important energy loss mechanism. Finite size also limits the instability growth rate. In the propagation of CIV, ion-molecule reactions and molecular dissociative recombination are important
Keywords :
atomic electron impact excitation; atomic metastable states; ion recombination; ion-molecule reactions; ionisation of gases; molecular dissociation; molecular electron impact excitation; molecular metastable states; plasma instability; plasma production; reviews; Townsend´s criterion; beam-plasma instabilities; critical velocity ionization; energy loss; energy pooling mechanism; instability growth; ion-molecule reactions; kinetic energies; low energy threshold; low-energy electrons; metastable states; molecular dissociative recombination; plasma wave energies; propagation; tail formation; time development; Chemical processes; Electrons; Ionization; Kinetic energy; Laboratories; Metastasis; Physics; Plasma chemistry; Plasma waves; Tail;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.24617
Filename :
24617
Link To Document :
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