DocumentCode
976930
Title
Wide-band de-embedding with a short, an open, and a through line
Author
Vaitkus, Rimantas L.
Author_Institution
Motorola, Inc., Phoenix, AZ, USA
Volume
74
Issue
1
fYear
1986
Firstpage
71
Lastpage
74
Abstract
A wide-band procedure for subtracting the effects of fixtures and device packages or carriers from measured scattering parameters with only a short, an open, and a through line as standards is presented.
Keywords
Circuits; Equations; Fixtures; Impedance; Measurement standards; Packaging; Scattering parameters; Testing; Transmission line matrix methods; Wideband;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1986.13404
Filename
1457672
Link To Document