• DocumentCode
    976930
  • Title

    Wide-band de-embedding with a short, an open, and a through line

  • Author

    Vaitkus, Rimantas L.

  • Author_Institution
    Motorola, Inc., Phoenix, AZ, USA
  • Volume
    74
  • Issue
    1
  • fYear
    1986
  • Firstpage
    71
  • Lastpage
    74
  • Abstract
    A wide-band procedure for subtracting the effects of fixtures and device packages or carriers from measured scattering parameters with only a short, an open, and a through line as standards is presented.
  • Keywords
    Circuits; Equations; Fixtures; Impedance; Measurement standards; Packaging; Scattering parameters; Testing; Transmission line matrix methods; Wideband;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1986.13404
  • Filename
    1457672