DocumentCode
977012
Title
Annealing phenomena in ion implanted bubble circuits
Author
Jouve, H. ; Gerard, P. ; Luc, A.
Author_Institution
L.E.T.I., GRENOBLE, France
Volume
16
Issue
5
fYear
1980
fDate
9/1/1980 12:00:00 AM
Firstpage
946
Lastpage
948
Abstract
The effects of annealing in air on the static and propagation properties of implanted bubble garnet films have been investigated at temperatures up to 600°C. Regular implanted profiles with thicknesses in the range of 0.5 to 0.6 μm have been created by using H+ or He + Ne ions. The capping layer effect responsible for the increase in the bubble collapse field rises monotonically with temperature. X rays and ferromagnetic resonance measurements show a regular decrease of lattice parameter change and stress induced anisotropy with increasing temperatures. The loss of propagation appears to occur when the stress induced anisotropy is no longer sufficient to force the magnetization to lie in the plane of the film.
Keywords
Magnetic bubble circuits; Magnetic thermal factors; Anisotropic magnetoresistance; Annealing; Circuits; Garnet films; Helium; Lattices; Magnetic field measurement; Magnetic resonance; Stress measurement; Temperature;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.1980.1060809
Filename
1060809
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