• DocumentCode
    977012
  • Title

    Annealing phenomena in ion implanted bubble circuits

  • Author

    Jouve, H. ; Gerard, P. ; Luc, A.

  • Author_Institution
    L.E.T.I., GRENOBLE, France
  • Volume
    16
  • Issue
    5
  • fYear
    1980
  • fDate
    9/1/1980 12:00:00 AM
  • Firstpage
    946
  • Lastpage
    948
  • Abstract
    The effects of annealing in air on the static and propagation properties of implanted bubble garnet films have been investigated at temperatures up to 600°C. Regular implanted profiles with thicknesses in the range of 0.5 to 0.6 μm have been created by using H+ or He + Ne ions. The capping layer effect responsible for the increase in the bubble collapse field rises monotonically with temperature. X rays and ferromagnetic resonance measurements show a regular decrease of lattice parameter change and stress induced anisotropy with increasing temperatures. The loss of propagation appears to occur when the stress induced anisotropy is no longer sufficient to force the magnetization to lie in the plane of the film.
  • Keywords
    Magnetic bubble circuits; Magnetic thermal factors; Anisotropic magnetoresistance; Annealing; Circuits; Garnet films; Helium; Lattices; Magnetic field measurement; Magnetic resonance; Stress measurement; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1980.1060809
  • Filename
    1060809