Title :
iDD pulse response testing: a unified approach to testing digital and analogue ICs
Author :
Beasley, J. ; Ramamurthy, H. ; Ramirez-Angulo, Jaime
Author_Institution :
Dept. of Electr. & Comput. Eng., New Mexico State Univ., Las Cruces, NM, USA
Abstract :
A test method is presented for detecting defects and fabrication variations in both digital and analogue circuits by simultaneously pulsing the power supply rails and analysing the temporal and/or the spectral characteristics of the resulting transient rail currents. The presented method has a distinct advantage over other forms of iDD testing because it requires a single test vector to excite and expose the presence of a defect or fabrication variations.
Keywords :
VLSI; digital integrated circuits; integrated circuit testing; linear integrated circuits; spectral analysis; analogue ICs; defects detection; digital ICs; fabrication variations; i DD pulse response testing; power supply rails; single test vector; spectral characteristics; temporal characteristics; transient rail currents;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19931405
