• DocumentCode
    977708
  • Title

    A Neural Network Degradation Model for Computing and Updating Residual Life Distributions

  • Author

    Gebraeel, Nagi Z. ; Lawley, Mark A.

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • Volume
    5
  • Issue
    1
  • fYear
    2008
  • Firstpage
    154
  • Lastpage
    163
  • Abstract
    The ability to accurately estimate the residual life of partially degraded components is arguably the most challenging problem in prognostic condition monitoring. This paper focuses on the development of a neural network-based degradation model that utilizes condition-based sensory signals to compute and continuously update residual life distributions of partially degraded components. Initial predicted failure times are estimated through trained neural networks using real-time sensory signals. These estimates are used to derive a prior failure time distribution for the component that is being monitored. Subsequent failure time estimates are then utilized to update the prior distributions using a Bayesian approach. The proposed methodology is tested using real world vibration-based degradation signals from rolling contact thrust bearings. The proposed methodology performed favorably when compared to other reliability-based and statistical-based benchmarks.
  • Keywords
    Bayes methods; computerised monitoring; condition monitoring; failure analysis; life testing; maintenance engineering; neural nets; Bayesian approach; condition-based sensory signals; failure time distribution; neural network degradation model; prognostic condition monitoring; reliability-based benchmark; residual life distribution; statistical-based benchmark; Biomedical engineering; Computer networks; Condition monitoring; Costs; Degradation; Distributed computing; Maintenance; Manufacturing industries; Neural networks; Testing; Degradation modeling; neural network; reliability; vibrations;
  • fLanguage
    English
  • Journal_Title
    Automation Science and Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1545-5955
  • Type

    jour

  • DOI
    10.1109/TASE.2007.910302
  • Filename
    4383449