• DocumentCode
    978475
  • Title

    Approximate analytic current-voltage calculations for MODFETs

  • Author

    Khondker, A.N. ; Anwar, A.F.M.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Clarkson Univ., Potsdam, NY, USA
  • Volume
    37
  • Issue
    1
  • fYear
    1990
  • fDate
    1/1/1990 12:00:00 AM
  • Firstpage
    314
  • Lastpage
    317
  • Abstract
    Two analytic techniques to calculate the current-voltage (I -V) characteristics of modulation-doped field-effect transistors (MODFETs) are presented. The present methods are based on the model of C.S. Chang and H.R. Fetterman (1987). However, the velocity-field dependence is approximated by a different empirical relation than was used to model Si MOSFETs. The advantage of using this empirical relation is that it gives analytic expressions for the I -V characteristics and the microwave small signal parameters. Moreover, the theoretical results are in good agreement with the experimental results
  • Keywords
    high electron mobility transistors; semiconductor device models; solid-state microwave devices; I-V characteristics; MODFETs; Si; current-voltage calculations; empirical relation; microwave small signal parameters; velocity-field dependence; Annealing; Crystallization; Electron mobility; HEMTs; Implants; MODFETs; Semiconductor films; Silicon; Temperature; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.43836
  • Filename
    43836