DocumentCode :
978555
Title :
Frequency dependence of the quality factor of Nb-NbxOy-Pb Josephson tunnel junctions
Author :
Cucolo, A.M. ; Pace, S. ; Vaglio, R. ; Lacquaniti, V. ; Marullo, G.
Author_Institution :
Università di Salerno, Salerno, Italy
Volume :
17
Issue :
1
fYear :
1981
fDate :
1/1/1981 12:00:00 AM
Firstpage :
812
Lastpage :
814
Abstract :
In the context of Josephson devices optimization for the Italian Voltage Standard manteinance, the frequency dependence of the quality factor (Q) of Nb-NbxOy-Pb tunnel junctions has been carefully measured at various temperatures in the frequency range 10-160 GHz. The Q was determined via the measure of the amplitude of Fiske resonant modes in the junction. The different frequencies were obtained by changing the lenght of the junction after the liquid helium test through a photolitographic process. The results show that for our junctions, for current densities of 1-10 Amp/cm2,the only relevant contributions to the Q are the losses associated with the surface impedance of the superconducting films. The data show good agreement with the BCS theory if, as already pointed out by other authors, a small residual term is added to the conductivity.
Keywords :
Josephson devices; Millimeter-wave measurements; Q measurement; Voltage measurement standards; Frequency dependence; Frequency measurement; Measurement standards; Q factor; Q measurement; Superconducting devices; Temperature dependence; Temperature distribution; Temperature measurement; Voltage;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/TMAG.1981.1060958
Filename :
1060958
Link To Document :
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