• DocumentCode
    979513
  • Title

    Very low noise all-niobium DC SQUIDs

  • Author

    de Waal, V.J. ; van den Hamer, P. ; Mooij, J.E. ; Klapwijk, T.M.

  • Author_Institution
    Laboratorium voor Technische Natuurkunde, Delft, The Netherlands
  • Volume
    17
  • Issue
    1
  • fYear
    1981
  • fDate
    1/1/1981 12:00:00 AM
  • Firstpage
    858
  • Lastpage
    860
  • Abstract
    All-niobium thin film planar DC SQUIDs have been fabricated, containing submicron tunnel junctions. The fabrication method using photoresist techniques is briefly described. The IcR product of the SQUIDs is 0.3 mV, the inductance 1 nH. They show no changes after repeated thermal cycling or storage over extended periods. The best intrinsic energy resolution obtained so far in a flux-locked loop configuration is 4 . 10-32J/Hz. The noise power is an order of magnitude higher than predicted from the simple RSJ model calculation.
  • Keywords
    Josephson device noise; Chromium; Energy resolution; Fabrication; Inductance; Niobium; Resists; SQUIDs; Semiconductor films; Silicon; Substrates;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061049
  • Filename
    1061049
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=979513