Title :
Photodisplacement microscopy using a semiconductor laser
Author :
Martin, Yves ; Ash, E.A.
Author_Institution :
University College London, Department of Electrical & Electronic Engineering, London, UK
Abstract :
A photodisplacement microscope has been realised, using a modulated semiconductor laser as the heating source and a phase sensitive HeNe laser probe for detection. Experimental results indicate that the instrument can have a wide range of applicability, including problems in nondestructive examination.
Keywords :
acoustic microscopes; nondestructive testing; photoacoustic effect; semiconductor junction lasers; heating source; modulated semiconductor laser; nondestructive testing; phase sensitive HeNe laser probe; photodisplacement microscope;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19820516
