• DocumentCode
    980441
  • Title

    An exact solution to the transistor sizing problem for CMOS circuits using convex optimization

  • Author

    Sapatnekar, Sachin S. ; Rao, Vasant B. ; Vaidya, Pravin M. ; Kang, Sung-Mo

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
  • Volume
    12
  • Issue
    11
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    1621
  • Lastpage
    1634
  • Abstract
    A general sequential circuit consists of a number of combinational stages that lie between latches. For the circuit to meet a given clocking specification, it is necessary for each combinational stage to satisfy a certain delay requirement. Roughly speaking, increasing the sizes of some transistors in a stage reduces the delay, with the penalty of increased area. The problem of transistor sizing is to minimize the area of a combinational stage, subject to its delay being less than a given specification. Although this problem has been recognized as a convex programming problem, most existing approaches do not take full advantage of this fact, and often give nonoptimal results. An efficient convex optimization algorithm has been used here. This algorithm is guaranteed to find the exact solution to the convex programming problem. We have also improved upon existing methods for computing the circuit delay as an Elmore time constant, to achieve higher accuracy, CMOS circuit examples, including a combinational circuit with 832 transistors are presented to demonstrate the efficacy of the new algorithm
  • Keywords
    CMOS integrated circuits; circuit analysis computing; combinatorial circuits; convex programming; delays; integrated logic circuits; logic CAD; sequential circuits; CMOS circuits; Elmore time constant; circuit delay; clocking specification; combinational stages; convex optimization algorithm; delay requirement; logic circuits; sequential circuit; transistor sizing problem; Clocks; Combinational circuits; Computer science; Delay effects; Digital integrated circuits; Helium; Latches; MOS integrated circuits; Sequential circuits; Size measurement;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.248073
  • Filename
    248073