DocumentCode
980451
Title
Exhaustive simulation need not require an exponential number of tests
Author
Brand, Daniel
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
12
Issue
11
fYear
1993
fDate
11/1/1993 12:00:00 AM
Firstpage
1635
Lastpage
1641
Abstract
Simulation is today the most common form of verification. One disadvantage of simulation is the excessive number of tests needed for complete coverage. However, as will be shown, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise
Keywords
circuit analysis computing; digital simulation; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Circuit testing; Computational modeling; Design automation; Hardware; Notice of Violation;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.248074
Filename
248074
Link To Document