• DocumentCode
    980451
  • Title

    Exhaustive simulation need not require an exponential number of tests

  • Author

    Brand, Daniel

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    12
  • Issue
    11
  • fYear
    1993
  • fDate
    11/1/1993 12:00:00 AM
  • Firstpage
    1635
  • Lastpage
    1641
  • Abstract
    Simulation is today the most common form of verification. One disadvantage of simulation is the excessive number of tests needed for complete coverage. However, as will be shown, the number of tests may be substantially reduced if test case generation is combined with a structural analysis. The resulting set of test cases for exhaustive simulation may be smaller than exponential, which might make exhaustive simulation feasible. Even if the set of test cases is still too large, choosing tests from this reduced set results in better coverage than otherwise
  • Keywords
    circuit analysis computing; digital simulation; complete coverage; exhaustive simulation; structural analysis; test case generation; verification; Circuit simulation; Circuit testing; Computational modeling; Design automation; Hardware; Notice of Violation;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.248074
  • Filename
    248074