• DocumentCode
    980658
  • Title

    Analog VLSI architectures for motion processing: from fundamental limits to system applications

  • Author

    Sarpeshkar, Rahul ; Kramer, Jörg ; Indiveri, Giacomo ; Koch, Christof

  • Author_Institution
    Comput. & Neural Syst. Program, California Inst. of Technol., Pasadena, CA, USA
  • Volume
    84
  • Issue
    7
  • fYear
    1996
  • fDate
    7/1/1996 12:00:00 AM
  • Firstpage
    969
  • Lastpage
    987
  • Abstract
    This paper discusses some of the fundamental issues in the design of highly parallel, dense, low-power motion sensors in analog VLSI. Since photoreceptor circuits are an integral part of all visual motion sensors, we discuss how the sizing of photosensitive areas can affect the performance of such systems. We review the classic gradient and correlation algorithms and give a survey of analog motion-sensing architectures inspired by them. We calculate how the measurable speed range scales with signal-to-noise ratio (SNR) for a classic Reichardt sensor with a fixed time constant. We show how this speed range may be improved using a nonlinear filter with an adaptive time constant, constructed out of a diode and a capacitor, and present data from a velocity sensor based on such a filter. Finally, we describe how arrays of such velocity sensors call be employed to compute the heading direction of a moving subject and to estimate the time-to-contact between the sensor and a moving object
  • Keywords
    VLSI; analogue processing circuits; motion estimation; parallel architectures; Reichardt sensor; adaptive time constant; analog VLSI architectures; correlation algorithm; gradient algorithm; heading direction; motion processing; nonlinear filter; parallel low-power visual motion sensors; photoreceptor circuits; signal-to-noise ratio; speed range; time-to-contact; velocity sensor arrays; Circuits; Nonlinear filters; Photoreceptors; Sensor arrays; Sensor phenomena and characterization; Sensor systems; Signal to noise ratio; Time measurement; Velocity measurement; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.503298
  • Filename
    503298