DocumentCode :
981483
Title :
Innovative Amorphous Silicon Balanced Ultraviolet Photodiode
Author :
Caputo, Domenico ; De Cesare, Giampiero ; Nascetti, Augusto
Author_Institution :
Dept. of Electron. Eng., Univ. of Rome La Sapienza, Rome
Volume :
29
Issue :
12
fYear :
2008
Firstpage :
1299
Lastpage :
1301
Abstract :
An innovative balanced photodiode structure made in amorphous silicon/amorphous silicon carbide, suitable for detecting small current variations on a large background signal, is presented and characterized. The structure is a three-terminal device, constituted by two series-connected n-i-p photosensors, where the output signal is the difference between the currents flowing through the two diodes. The layer thickness and optical properties of the thin-film materials and the geometry of the structure have been optimized for the detection of ultraviolet radiation. Common mode rejection ratio (CMRR) values ranging between 30 dB at 254 nm and 42 dB at 365 nm have been measured, independent on the bias voltage. The decrease of the CMRR at lower wavelengths has been ascribed to differences in the surfaces of the two diodes exposed to the light.
Keywords :
amorphous semiconductors; elemental semiconductors; photodiodes; silicon; silicon compounds; wide band gap semiconductors; Si-SiC; amorphous silicon balanced ultraviolet photodiode; amorphous silicon-amorphous silicon carbide; large background signal; n-i-p photosensors; small current variation; three-terminal device; wavelength 254 nm; wavelength 365 nm; Amorphous materials; p-i-n photodiodes; ultraviolet (UV) detectors;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2008.2005590
Filename :
4668444
Link To Document :
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