DocumentCode
981671
Title
Digital signal processor for test and measurement environment
Author
Kareem, Arif ; Saxe, Charles L. ; Etheridge, Eric ; McKinney, David
Author_Institution
Tektronix Inc., Beaverton, OR, USA
Volume
75
Issue
9
fYear
1987
Firstpage
1167
Lastpage
1171
Abstract
This paper describes a high-performance digital signal processor, TriStar, developed for signal processing applications in test and measuring instruments. It executes typical signal processing tasks with very high throughput because of the concurrent operation of three units: instruction fetch unit, arithmetic unit, and address computation unit. A parallel architecture in addition to single-cycle operations allows the TriStar to run signal processing algorithms with an efficiency never before available to an instrument designer.
Keywords
Arithmetic; Computer aided instruction; Concurrent computing; Digital signal processing; Digital signal processors; Instruments; Parallel architectures; Signal processing algorithms; Testing; Throughput;
fLanguage
English
Journal_Title
Proceedings of the IEEE
Publisher
ieee
ISSN
0018-9219
Type
jour
DOI
10.1109/PROC.1987.13869
Filename
1458136
Link To Document