• DocumentCode
    981671
  • Title

    Digital signal processor for test and measurement environment

  • Author

    Kareem, Arif ; Saxe, Charles L. ; Etheridge, Eric ; McKinney, David

  • Author_Institution
    Tektronix Inc., Beaverton, OR, USA
  • Volume
    75
  • Issue
    9
  • fYear
    1987
  • Firstpage
    1167
  • Lastpage
    1171
  • Abstract
    This paper describes a high-performance digital signal processor, TriStar, developed for signal processing applications in test and measuring instruments. It executes typical signal processing tasks with very high throughput because of the concurrent operation of three units: instruction fetch unit, arithmetic unit, and address computation unit. A parallel architecture in addition to single-cycle operations allows the TriStar to run signal processing algorithms with an efficiency never before available to an instrument designer.
  • Keywords
    Arithmetic; Computer aided instruction; Concurrent computing; Digital signal processing; Digital signal processors; Instruments; Parallel architectures; Signal processing algorithms; Testing; Throughput;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/PROC.1987.13869
  • Filename
    1458136