Simple method to evaluate coupling functions at antireflection-coated diode facets facing grating reflectors of long external cavities

Author

Chen, Jianguo ; Li, Binzhong ; Wu, Lan ; Li, Dayi ; Lu, Yucun

Author_Institution

Dept. of Optoelectron., Sichuan Univ., Chengdu, China

Volume

5

Issue

10

fYear

1993

Firstpage

1174

Lastpage

1176

Abstract

The spectral content of the reflected light from a grating, positioned at a distance much longer than the diode length to form an external-cavity semiconductor laser, has been studied. The analytical expressions derived show that the coupling coefficient at the antireflection (AR)-coated diode facet facing the extended cavity can be divided into two factors, of which one is due to the off-overlapping between the centers of the diode mode and its reflected counterpart, and the other is due to the alteration of the wave vector after being dispersed by the grating.<>

Keywords

antireflection coatings; diffraction gratings; laser cavity resonators; laser theory; optical films; reflectivity; semiconductor lasers; analytical expressions; antireflection-coated diode facets; coupling coefficient; coupling functions; diode length; diode mode; external-cavity semiconductor laser; grating reflectors; long external cavities; off-overlapping; reflected light; spectral content; wave vector; Collimators; Diffraction gratings; Laser modes; Lenses; Optical coupling; Optical feedback; Optical reflection; Semiconductor diodes; Semiconductor lasers; Tunable circuits and devices;

fLanguage

English

Journal_Title

Photonics Technology Letters, IEEE

Publisher

ieee

ISSN

1041-1135

Type

jour

DOI

10.1109/68.248418

Filename

248418