Title :
Scaling of Nanowire Transistors
Author :
Yu, Bo ; Wang, Lingquan ; Yuan, Yu ; Asbeck, Peter M. ; Taur, Yuan
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of California-San Diego, San Diego, CA
Abstract :
This paper considers the scaling of nanowire transistors to 10-nm gate lengths and below. The 2-D scale length theory for a cylindrical surrounding-gate MOSFET is reviewed first, yielding a general guideline between the gate length and the nanowire size for acceptable short-channel effects. Quantum confinement of electrons in the nanowire is discussed next. It gives rise to a ground-state energy and, therefore, a threshold voltage dependent on the radius of the nanowire. The scaling limit of nanowire transistors hinges on how precise the nanowire size can be controlled. The performance limit of a nanowire transistor is then assessed by applying a ballistic current model. Key issues such as the density of states of the nanowire material are discussed. Comparisons are made between the model results and the published experimental data of nanowire devices.
Keywords :
MOSFET; ballistic transport; nanoelectronics; nanowires; semiconductor device models; semiconductor quantum wires; ballistic current model; ballistic transport; cylindrical surrounding-gate MOSFET; ground-state energy; nanowire transistors; quantum confinement; short-channel effects; transistor scaling; Effective mass; Electrons; Electrostatics; Fasteners; Guidelines; MOSFET circuits; Nanoscale devices; Potential well; Silicon; Threshold voltage; Ballistic transport; MOSFETs; nanowire; quantum confinement; scaling; short-channel effect (SCE);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2008.2005163