• DocumentCode
    985256
  • Title

    Thermal effects on the characteristics of AlGaAs/GaAs heterojunction bipolar transistors using two-dimensional numerical simulation

  • Author

    Liou, Lee L. ; Ebel, John L. ; Huang, Chern I.

  • Author_Institution
    Wright Lab., Wright-Patterson AFB, OH, USA
  • Volume
    40
  • Issue
    1
  • fYear
    1993
  • fDate
    1/1/1993 12:00:00 AM
  • Firstpage
    35
  • Lastpage
    43
  • Abstract
    Two-dimensional numerical simulations incorporating the spatial distributions of the energy band and temperature were used to study AlGaAs/GaAs heterojunction bipolar transistor characteristics. It was found that the negative differential resistance and the reduction of the base-emitter voltage for a constant base current in the active region are due to thermal effects. The differential current gain and cutoff frequency decrease when the transistor is operated at high power levels. The temperature distribution of the transistor operated in the active region shows a maximum at the collector region right beneath the emitter mesa. When the transistor is operated in the saturation region, the emitter contact region may be at a slightly lower temperature than the heat sink temperature. This thermoelectric cooling effect results from the utilization of the thermodynamically compatible current and energy flow formulations in which the energy band discontinuities are part of the thermoelectric power
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; semiconductor device models; AlGaAs-GaAs; III-V semiconductors; active region; base-emitter voltage; constant base current; cutoff frequency; differential current gain; energy band; energy band discontinuities; heterojunction bipolar transistors; negative differential resistance; saturation region; spatial distributions; temperature distribution; thermal effects; thermoelectric cooling effect; two-dimensional numerical simulation; Cooling; Cutoff frequency; Gallium arsenide; Heat sinks; Heterojunction bipolar transistors; Numerical simulation; Temperature distribution; Thermal resistance; Thermoelectricity; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.249421
  • Filename
    249421