• DocumentCode
    985563
  • Title

    Preparation of amorphous magnetic thin film by two source r.f. magnetron sputtering

  • Author

    Onishi, K. ; Shibata, Y. ; Matsushita, S. ; Sakurai, Y.

  • Author_Institution
    Osaka University, Osaka, Japan.
  • Volume
    17
  • Issue
    6
  • fYear
    1981
  • fDate
    11/1/1981 12:00:00 AM
  • Firstpage
    3070
  • Lastpage
    3072
  • Abstract
    Magnetic properties of rare earth-transition metal amorphous films deposited by the multiple target r.f. magnetron sputtering method were studied. These films have microscopically multi-layered structure, because rare earth element and transition metal element deposit alternately onto a substrate. So, the magnetic spin interaction is supposed to be different from that of the film made by other conventional deposition technique, for example sputtering from mosaic target or vacuum evaporation from the alloy target. The results of torque measurement showed that the easy axis of Gd-Fe film and Tb-Fe film declined from the film normal. Uniformity of compensation temperature, Curie temperature and coercivity over a wide area was fairly good under the insertion of the window, which was designed to maintain constant the film composition and to decrease the oblique incidence of sputtered atom onto substrate. The critical deposition rate per revolution was about 10 Å/rev, where the transition of electrical resistivity occurs, and the change of magnetic anisotropy occurs at 8 Å/rev for Gd-Fe and 12 Å/rev for Tb-Fe.
  • Keywords
    Amorphous magnetic films/devices; Magnetic films; Sputtering; Amorphous magnetic materials; Amorphous materials; Magnetic anisotropy; Magnetic films; Magnetic properties; Microscopy; Perpendicular magnetic anisotropy; Sputtering; Substrates; Temperature;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.1981.1061596
  • Filename
    1061596