A grounded coplanar waveguide technique for microwave measurement of complex permittivity and permeability

Author

Sligar, A. ; Chih-Hung Chang ; Shih-Lien Lu ; Settaluri, R.K.

Volume

42

Issue

7

fYear

2006

fDate

7/1/2006 12:00:00 AM

Firstpage

1929

Lastpage

1931

Abstract

We present a method for extracting the complex permittivity and permeability of dielectric/magnetic thin films in a grounded coplanar waveguide configuration. The technique is applicable for extraction of these material parameters for lossy and lossless materials over a broad frequency range with high accuracy. For validation, we extracted complex permittivity and permeability, using the scattering parameters obtained from the full-wave electromagnetic simulation for two test cases over a frequency range of 5 to 15 GHz. Accuracy for both dielectric as well as magnetic materials is within 2% error.

Keywords

S-parameters; conformal mapping; coplanar waveguides; dielectric thin films; magnetic permeability measurement; magnetic thin films; microwave measurement; permittivity measurement; 5 to 15 GHz; complex permeability; complex permittivity; dielectric thin films; full-wave electromagnetic simulation; grounded coplanar waveguide configuration; lossless materials; lossy materials; magnetic thin films; material parameters; microwave measurement; scattering parameters; Coplanar waveguides; Dielectric materials; Dielectric measurements; Electromagnetic waveguides; Frequency; Magnetic materials; Microwave measurements; Microwave theory and techniques; Permeability measurement; Permittivity measurement; Complex permeability; complex permittivity; conformal mapping; full-wave EM simulation; grounded coplanar waveguide;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/TMAG.2006.874098

Filename

1644913