• DocumentCode
    986452
  • Title

    Minimisation of on-resistance of VDMOS power FETs

  • Author

    Byrne, D.J. ; Board, K.

  • Author_Institution
    University College of Swansea, Department of Electrical & Electronic Engineering, Swansea, UK
  • Volume
    19
  • Issue
    14
  • fYear
    1983
  • Firstpage
    519
  • Lastpage
    521
  • Abstract
    The minimisation of on-resistance of power MOSFETs is a problem of considerable importance to high-voltage MOS designers. The results of a two-dimensional simulation of VDMOS structures are presented, with linear and hexagonal surface geometries, which takes account of the finite sheet resistance of the accumulation layer under the extended gate region. A simple distributed analytic model is also introduced which gives reasonable agreement with the numerical model and which may be used to give the functional relation ship of the on-resistance with device parameters.
  • Keywords
    insulated gate field effect transistors; power transistors; semiconductor device models; VDMOS; accumulation layer; distributed analytic model; finite sheet resistance; hexagonal surface geometries; linear surface geometry; on-resistance minimisation; power MOSFET; two-dimensional simulation; vertical DMOS structure;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830353
  • Filename
    4247845