DocumentCode
986841
Title
Electro-optic sampling with picosecond resolution
Author
Kolner, B.H. ; Bloom, D.M. ; Cross, P.S.
Author_Institution
Hewlett-Packard Laboratories, Palo Alto, USA
Volume
19
Issue
15
fYear
1983
Firstpage
574
Lastpage
575
Abstract
The development of an electro-optic sampling system with resolution of better than 2 picoseconds and shot noise limited sensitivity of 11 ¿V/¿Hz is reported. This system has been used to characterise GaAs photodiodes which have exhibited pulsewidths as short as 5.4 picoseconds (full-width-half-maximum).
Keywords
III-V semiconductors; characteristics measurement; electro-optical devices; gallium arsenide; photodiodes; GaAs photodiodes; electro-optic sampling system; pulsewidths; resolution; shot noise limited sensitivity;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19830391
Filename
4247886
Link To Document