• DocumentCode
    987286
  • Title

    Syndrome-testable internally unate combinational networks

  • Author

    Eris, E. ; Miller, D.M.

  • Author_Institution
    University of Manitoba, Department of Computer Science, Winnipeg, Canada
  • Volume
    19
  • Issue
    16
  • fYear
    1983
  • Firstpage
    637
  • Lastpage
    638
  • Abstract
    A combinational network is syndrome-testable with respect to a particular fault if the faulty network realises a function with a different number of ones from the function realised by the fault-free network. Here we investigate the syndrometestability of single stuck-at faults in internally unate combinational networks. We show how such a network can be made syndrome-testable for single stuck-at faults by the addition of a single control line. In the case of a two-level network, at most one additional first-level gate is added to the network.
  • Keywords
    combinatorial circuits; fault location; logic testing; faulty network; first-level gate; internally unate combinational networks; logic testing; single control line; single struck-at faults; syndrome-testable; two-level network;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830434
  • Filename
    4247932