Comparison of smoothness evaluation devices for power cable compounds

Author

Flenniken, C.L. ; Keefe, R.J.

Author_Institution

BICC Cables Corp., Indianapolis, IN, USA

Volume

9

Issue

1

fYear

1993

Firstpage

22

Lastpage

29

Abstract

A variety of data from different devices has been generated on the smoothness of shield products, but no direct comparison of compound smoothness for the devices themselves has been made. The purpose of this study was to compare four different methods for evaluating the smoothness of power cable compounds. The methods compared include: image analysis, laser scanning, mechanical profilometry and photomicroscopy with visual rating. Extruded tape samples of conductor shields, filled insulations and strippable shields were evaluated.<>

Keywords

cable insulation; cable sheathing; measurement by laser beam; optical microscopy; power cables; surface topography measurement; conductor shields; extruded tape samples; filled insulations; image analysis; laser scanning; mechanical profilometry; photomicroscopy; power cable compounds; shield products; smoothness evaluation devices; strippable shields; Cable insulation; Computer interfaces; Conducting materials; Dielectric materials; Image analysis; Inspection; Laser noise; Power cables; Semiconductor device noise; Semiconductor materials;

fLanguage

English

Journal_Title

Electrical Insulation Magazine, IEEE

Publisher

ieee

ISSN

0883-7554

Type

jour

DOI

10.1109/57.249922

Filename

249922