• DocumentCode
    987596
  • Title

    Active Integrity Constraints for Database Consistency Maintenance

  • Author

    Caroprese, Luciano ; Greco, Sergio ; Zumpano, Ester

  • Author_Institution
    Dept. of Electron., Comput. & Syst. Sci., Univ. of Calabria, Rende
  • Volume
    21
  • Issue
    7
  • fYear
    2009
  • fDate
    7/1/2009 12:00:00 AM
  • Firstpage
    1042
  • Lastpage
    1058
  • Abstract
    This paper introduces active integrity constraints (AICs), an extension of integrity constraints for consistent database maintenance. An active integrity constraint is a special constraint whose body contains a conjunction of literals which must be false and whose head contains a disjunction of update actions representing actions (insertions and deletions of tuples) to be performed if the constraint is not satisfied (that is its body is true). The AICs work in a domino-like manner as the satisfaction of one AIC may trigger the violation and therefore the activation of another one. The paper also introduces founded repairs, which are minimal sets of update actions that make the database consistent, and are specified and ldquosupportedrdquo by active integrity constraints. The paper presents: 1) a formal declarative semantics allowing the computation of founded repairs and 2) a characterization of this semantics obtained by rewriting active integrity constraints into disjunctive logic rules, so that founded repairs can be derived from the answer sets of the derived logic program. Finally, the paper studies the computational complexity of computing founded repairs.
  • Keywords
    computational complexity; database management systems; software maintenance; active integrity constraints; computational complexity; database consistency maintenance; formal declarative semantics; Database semantics; Relational databases; consistent query answering.; database repairs; inconsistent databases;
  • fLanguage
    English
  • Journal_Title
    Knowledge and Data Engineering, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1041-4347
  • Type

    jour

  • DOI
    10.1109/TKDE.2008.226
  • Filename
    4674350