Title :
A review on RF ESD protection design
Author :
Wang, ZhiHua ; Feng, Haigang ; Zhan, Rouying ; Xie, Haolu ; Chen, Guang ; Wu, Qiong ; Guan, Xiaokang ; Zhihua Wang ; Zhang, Chun
Author_Institution :
Dept. of Electron. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fDate :
7/1/2005 12:00:00 AM
Abstract :
Radio frequency (RF) electrostatic discharge (ESD) protection design emerges as a new challenge to RF integrated circuits (IC) design, where the main problem is associated with the complex interactions between the ESD protection network and the core RFIC circuit being protected. This paper reviews recent development in RF ESD protection circuit design, including mis-triggering of RF ESD protection structures, ESD-induced parasitic effects on RFIC performance, RF ESD protection solutions, as well as characterization of RF ESD protection circuits.
Keywords :
electrostatic discharge; integrated circuit design; protection; radiofrequency integrated circuits; ESD-induced parasitic effect; RF ESD protection circuits; RF ESD protection structures; RF integrated circuit design; electrostatic discharge protection design; radio frequency electrostatic discharge; Circuit synthesis; Electrostatic discharge; Handheld computers; Integrated circuit noise; Protection; Radio frequency; Radiofrequency identification; Radiofrequency integrated circuits; Research and development; Semiconductor device noise; Electrostatic discharge (ESD); electrostatic discharge (ESD) protection; parasitic; radio frequency (RF) electrostatic discharge (ESD);
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2005.850652
