• DocumentCode
    988015
  • Title

    Direct observation of visibility curve of semiconductor lasers

  • Author

    Eickhoff, W. ; Brinkmeyer, Ernst ; Barfu¿?, H.

  • Author_Institution
    Technische Universitÿt Hamburg-Harburg, Hamburg, West Germany
  • Volume
    19
  • Issue
    18
  • fYear
    1983
  • Firstpage
    739
  • Lastpage
    740
  • Abstract
    A method for the determination of the linewidth of semiconductor lasers is demonstrated. It employs tuning of the laser frequency, observation of the backscattered light from a single-mode fibre and Fourier-transform evaluation.
  • Keywords
    laser beams; light interferometry; optical variables measurement; semiconductor junction lasers; Fourier-transform evaluation; backscattered light observation; laser frequency tuning; light interferometry; linewidth; optical variables measurement; semiconductor lasers; single-mode fibre; visibility curve;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19830503
  • Filename
    4248008
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=988015