• DocumentCode
    988029
  • Title

    Linearity and power characteristics of SiGe HBTs at high temperatures for RF applications

  • Author

    Chen, Kun-Ming ; Peng, An-Sam ; Huang, Guo-Wei ; Chen, Han-Yu ; Huang, Sheng-Yi ; Chang, Chun-Yen ; Tseng, Hua-Chou ; Hsu, Tsun-Lai ; Liang, Victor

  • Author_Institution
    Nat. Nano Device Labs., Hsinchu, Taiwan
  • Volume
    52
  • Issue
    7
  • fYear
    2005
  • fDate
    7/1/2005 12:00:00 AM
  • Firstpage
    1452
  • Lastpage
    1458
  • Abstract
    In this paper, the power gain, power-added efficiency (PAE) and linearity of power SiGe heterojunction-bipolar transistors at various temperatures have been presented. The power characteristics were measured using a two-tone load-pull system. For transistors biased with fixed base voltage, the small-signal power gain and PAE of the devices increase with increasing temperature at low base voltages, while they decrease at high base voltages. Besides, the linearity is improved at high temperature for all voltage biases. However, for devices with fixed collector current, the small-signal power gain, PAE, and linearity are nearly unchanged with temperature. The temperature dependence of power and linearity characteristics can be understood by analyzing the cutoff frequency, the collector current, Kirk effect and nonlinearities of transconductance at different temperatures.
  • Keywords
    Ge-Si alloys; heterojunction bipolar transistors; radiofrequency integrated circuits; semiconductor device testing; Kirk effect; RF application; SiGe; SiGe HBT; collector current; cutoff frequency; heterojunction-bipolar transistor; linearity characteristic; power gain; power-added efficiency; transconductance nonlinearity; two-tone load-pull system; voltage bias; Cutoff frequency; Germanium silicon alloys; Kirk field collapse effect; Linearity; Low voltage; Power measurement; Radio frequency; Silicon germanium; Temperature dependence; Transconductance; Linearity; SiGe HBT; power gain; power-added efficiency; temperature;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2005.850633
  • Filename
    1459104