DocumentCode
988098
Title
Why are nonlinear microwave systems measurements so involved?
Author
Rolain, Yves ; Van Moer, Wendy ; Vandersteen, Gerd ; Schoukens, Johan
Author_Institution
Electr. Meas. Dept., Vrije Univ. Brussel, Belgium
Volume
53
Issue
3
fYear
2004
fDate
6/1/2004 12:00:00 AM
Firstpage
726
Lastpage
729
Abstract
Performing nonlinear measurements on microwave devices is a complex task. This paper introduces, step by step, the key concepts that make the difference between linear S-parameter measurements and nonlinear measurements. The main goal here is to make nonlinear measurements more accessible to the practicing microwave engineer.
Keywords
S-parameters; calibration; microwave devices; microwave measurement; nonlinear systems; linear 5-parameter measurements; microwave measurements; nonlinear calibration; nonlinear measurements; nonlinear microwave systems; nonlinear systems; scattering parameters; Calibration; Frequency; Government; Instruments; Linear systems; Microwave devices; Microwave measurements; Nonlinear systems; Power system modeling; Scattering parameters; Microwave measurements; nonlinear calibration; nonlinear measurement; nonlinear systems; scattering parameters;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2004.827297
Filename
1299134
Link To Document